assertTrue(s);
        }
    }

    @DisplayName("Test exception handling for invalid information levels")
    @ParameterizedTest
    @ValueSource(ints = { 0, 1, 2, 4, 5, 6, 8, 100, -2, -100, Integer.MIN_VALUE, Integer.MAX_VALUE })
    void testInvalidInformationLevels(int invalidLevel) {
        // Skip valid levels

      return CaseFormat.UPPER_UNDERSCORE.to(CaseFormat.UPPER_CAMEL, name());
    }
  }

  /** Timeout values to combine with each {@link Scenario}. */
  private enum Timeout {
    MIN(Long.MIN_VALUE, "-oo"),
    MINUS_SMALL(-SMALL_TIMEOUT_MILLIS, "-" + SMALL_TIMEOUT_MILLIS + "ms"),
    ZERO(0L, "0ms"),
    SMALL(SMALL_TIMEOUT_MILLIS, SMALL_TIMEOUT_MILLIS + "ms"),

 * @since 11.0
 */
@GwtCompatible
public final class UnsignedInts {
  static final long INT_MASK = 0xffffffffL;

  private UnsignedInts() {}

  static int flip(int value) {
    return value ^ Integer.MIN_VALUE;
  }

  /**
   * Compares the two specified {@code int} values, treating them as unsigned values between {@code
   * 0} and {@code 2^32 - 1} inclusive.
   *

   * @param p false positive rate (must be 0 < p < 1)
   */
  @VisibleForTesting
  static long optimalNumOfBits(long n, double p) {
    if (p == 0) {
      p = Double.MIN_VALUE;
    }
    return (long) (-n * Math.log(p) / SQUARED_LOG_TWO);
  }

    private Object writeReplace() {
    return new SerialForm<T>(this);
  }

   */

  /*
   * Timeout handling is intricate, especially given our ambitious goals:
   * - Avoid underflow and overflow of timeout values when specified timeouts are close to
   *   Long.MIN_VALUE or Long.MAX_VALUE.
   * - Favor responding to interrupts over timeouts.
   * - System.nanoTime() is expensive enough that we want to call it the minimum required number of